US Patent Issued to Apple on Dec. 2 for "Beam failure detection" (Chinese, American Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,489,510, issued on Dec. 2, was assigned to Apple Inc. (Cupertino, Calif.).

"Beam failure detection" was invented by Yushu Zhang (Beijing), Wei Zeng (San Diego), Dawei Zhang (Saratoga, Calif.), Haijing Hu (Beijing), Haitong Sun (Irvine, Calif.), Weidong Yang (San Diego), Yuchul Kim (Santa Clara, Calif.), Hong He (Cupertino, Calif.), Oghenekome Oteri (San Diego), Chunxuan Ye (San Diego), Chunhai Yao (Beijing), Jie Cui (San Jose, Calif.), Yang Tang (Cupertino, Calif.) and Yakun Sun (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments are presented herein of apparatuses, systems, and methods for a user equipment device (UE) to perform...