US Patent Issued to Apple on Aug. 5 for "Vernier scan architecture for self-mixing interferometry phase measurements" (California Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,199, issued on Aug. 5, was assigned to Apple Inc. (Cupertino, Calif.).

"Vernier scan architecture for self-mixing interferometry phase measurements" was invented by William Whitney (Cupertino, Calif.) and Mengshu Huang (Cupertino, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of estimating a velocity of an object using an SMI sensor. The method includes driving a light emitter of the SMI sensor with a chirped waveform. The chirped waveform includes a first chirp and a second chirp separated by a first time interval, and a third chirp separated from the second chirp by a second time interval. The method also includes deriving a freque...