US Patent Issued to Antares Advanced Test Technologies (Suzhou) on July 8 for "Semiconductor testing socket" (Chinese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,782, issued on July 8, was assigned to Antares Advanced Test Technologies (Suzhou) Ltd. (Jiangsu, China).

"Semiconductor testing socket" was invented by Long Zhang (Jiangsu, China), Chunli Zhuo (Jiangsu, China) and Jinrong Chen (Jiangsu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosed semiconductor testing socket comprises a testing socket body, a guiding frame, and a height adjusting mechanism. The guiding frame is mounted above the testing socket body and is provided with a central insertion opening. The height adjusting mechanism is embedded at the edges of the central insertion opening. The height adjusting mechanism comprises ...