US Patent Issued to ANRITSU on Sept. 30 for "Mobile terminal testing device and method for displaying EVM measurement result of SRS using same" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,987, issued on Sept. 30, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Mobile terminal testing device and method for displaying EVM measurement result of SRS using same" was invented by Naoki Inoue (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a mobile terminal testing device capable of easily referring to an EVM measurement result of an SRS by automatically calculating an allocation position of the SRS. The mobile terminal testing device includes: a pseudo base station unit 2 that transmits and receives an RF signal to and from a mobile terminal 10; a scenario processing unit 3 that transmits notification informati...