US Patent Issued to ANRITSU on Oct. 14 for "Mobile terminal test apparatus and parameter setting method thereof" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,445,210, issued on Oct. 14, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Mobile terminal test apparatus and parameter setting method thereof" was invented by Nobuaki Shimakawa (Kanagawa, Japan), Atsuki Morita (Kanagawa, Japan), Masahiro Arayama (Kanagawa, Japan), Daiki Kano (Kanagawa, Japan), Daisuke Nakagawa (Kanagawa, Japan) and Takumi Nakamura (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a mobile terminal test apparatus capable of easily assigning and setting a frequency of each CC in the same frequency band of carrier aggregation. An operation unit 4 that accepts an operation input from a user, a display uni...