US Patent Issued to ANRITSU on Oct. 14 for "Error rate measurement apparatus and error rate measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,856, issued on Oct. 14, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Error rate measurement apparatus and error rate measurement method" was invented by Tatsuya Iwai (Kanagawa, Japan) and Hironori Yoshioka (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An error rate measurement apparatus includes a display unit that displays a setting screen for setting a measurement condition of an error rate of an input signal from a DUT, and a processing unit that calculates a measurement time based on the measurement condition input to the setting screen, in which the setting screen includes a target confidence level input portion for input...