US Patent Issued to ANRITSU on Oct. 14 for "Error rate measurement apparatus and error rate measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,857, issued on Oct. 14, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Error rate measurement apparatus and error rate measurement method" was invented by Hironori Yoshioka (Kanagawa, Japan) and Tatsuya Iwai (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An error rate measurement apparatus includes a provisional confidence level calculation unit that calculates a provisional confidence level CLx by using the sum x, an upper and lower limit value update unit that substitutes the sum x for the variable min_x in a case where the provisional confidence level CLx is equal to or lower than a target confidence level CLs, and substitutes...