US Patent Issued to ANRITSU on Oct. 14 for "Analog signal generation device and calibration method of same" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,445,140, issued on Oct. 14, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Analog signal generation device and calibration method of same" was invented by Hirofumi Ono (Kanagawa, Japan) and Koji Yamashita (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An analog signal generation device according to the present invention includes a DA converter that adjusts a signal level of a digital signal according to a DAC correction amount and then converts the digital signal into an analog signal, a detector that detects the analog signal and outputs a detection signal, a storage unit that stores a characteristic equation for calculating the DAC...