ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,187, issued on Nov. 18, was assigned to ANRITSU Corp. (Kanagawa, Japan).
"Loss analysis device and loss analysis method" was invented by Ryota Takasu (Kanagawa, Japan) and Taichi Murakami (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present disclosure is to provide a loss analysis device and a loss analysis method of detecting an event with high reproducibility when an SN ratio is small or when an event interval is short. According to the present disclosure, a loss analysis device includes an OTDR waveform acquisition unit that acquires an OTDR waveform of a measurement target optical fiber, and a calculation unit...