ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,122, issued on Nov. 11, was assigned to ANRITSU Corp. (Kanagawa, Japan).
"Article inspection apparatus and article inspection method" was invented by Osamu Takata (Kanagawa, Japan) and Shinya Waki (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An article inspection apparatus inspects a workpiece W including a plurality of ingredients Wa, Wb, Wc, and Wd by using an inspection image of the workpiece. The article inspection apparatus includes an X-ray image memory 61 that stores information of a predetermined detection value related to the inspection image, a configuration determination unit 53 that determines a material configuration ...