ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,572, issued on May 27, was assigned to ANRITSU Corp. (Atsugi, Japan).
"X-ray inspection apparatus and X-ray inspection method" was invented by Masaru Ishida (Atsugi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes an X-ray generator; an X-ray detector; and a determination unit determining a quality state of an inspection object, based on an X-ray detection signal. The apparatus has an X-ray image storing unit storing a first inspection image, corresponding to the X-ray detection signal outputted from the X-ray detector, whose observation direction is the direction in which the X-rays transmits the inspecti...