US Patent Issued to ANRITSU on March 25 for "Mobile terminal test device and parameter setting method thereof" (Japanese Inventor)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,261,648, issued on March 25, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Mobile terminal test device and parameter setting method thereof" was invented by Naoki Inoue (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a mobile terminal test device capable of efficiently testing a mobile terminal compatible with NSA while suppressing a test configuration to be small. A mobile terminal test device includes a first analysis unit 24a and a second analysis unit 24b that analyze a signal received from a mobile terminal, a first port 21a, a second port 21b, a first port 31a, and a second port 31b connected to the mobile terminal,...