ALEXANDRIA, Va., March 19 -- United States Patent no. 12,256,158, issued on March 18, was assigned to ANRITSU Corp. (Kanagawa, Japan).
"Inspection apparatus" was invented by Masaru Ishida (Kanagawa, Japan), Hiroki Nakajima (Kanagawa, Japan) and Mikio Shibukawa (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "To provide an inspection apparatus capable of simultaneously picking up images of one side and the other side of an inspection item with an image pickup device. An inspection apparatus 1 includes a first conveyance unit 31 and a second conveyance unit 32 arranged with a predetermined gap G and inspects a workpiece W when the workpiece W passes over the predetermined gap G. The inspection a...