US Patent Issued to ANRITSU on March 18 for "Error rate measurement apparatus and error rate measurement method" (Japanese Inventor)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,924, issued on March 18, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Error rate measurement apparatus and error rate measurement method" was invented by Hiroyuki Onuma (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An error rate measurement apparatus includes an operation display unit and a display control unit. Displays a measurement result when the matrix scan function is executed. The display control unit displays a first coefficient value in a selectable manner by tabs of a number corresponding to the Full Swing value, uses each one of combinations of the first coefficient value, each second coefficient value, and each th...