US Patent Issued to ANRITSU on July 29 for "Error rate measurement apparatus and error rate measurement method" (Japanese Inventor)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,375,227, issued on July 29, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Error rate measurement apparatus and error rate measurement method" was invented by Hisao Kidokoro (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An operation unit 2 sets a Flit length according to the number of lanes, a mask pattern length and a mask pattern period for masking a portion corresponding to an SKP OS, and a threshold value for Flit error determination. In an error detector 4, a symbol mask generation unit 25 generates a mask pattern, an error detection unit 28 detects and counts an error in the portion corresponding to Flit by dividing the mask p...