US Patent Issued to ANRITSU on Aug. 5 for "Error rate measurement apparatus and error rate measurement method" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,381,576, issued on Aug. 5, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Error rate measurement apparatus and error rate measurement method" was invented by Hisao Kidokoro (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an error detector 4, a symbol mask generation unit 27 generates a mask pattern, an error detection unit 30 detects and counts an error in a portion corresponding to Flit in a PAM4 signal from a device under test W, and a Flit error detection unit 31 detects and counts an FEC symbol error in a portion corresponding to Flit for each ECC group, and determines in which the number of FEC symbol errors exceeds a threshold...