ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,347, issued on April 29, was assigned to ANRITSU Corp. (Kanagawa, Japan).
"Article inspection verification system" was invented by Eiji Asai (Kanagawa, Japan), Toshiaki Kikuchi (Kanagawa, Japan), Takamasa Ito (Kanagawa, Japan), Mami Ozawa (Kanagawa, Japan) and Tatsuya Inagaki (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an article inspection verification system provided in an article inspection line including a plurality of article inspection devices that determine whether an inspection target article is a non-defective product or a defective product. The article inspection verification system includes physical ef...