US Patent Issued to ANRITSU on April 1 for "Error rate measurement apparatus and error rate measurement method" (Japanese Inventor)

ALEXANDRIA, Va., April 2 -- United States Patent no. 12,265,120, issued on April 1, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Error rate measurement apparatus and error rate measurement method" was invented by Hiroyuki Onuma (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An error rate measurement apparatus includes a display control unit, an operation display unit, and a control unit. The display control unit displays a firsts coefficient value in a selectable manner by tabs of a number corresponding to a Full Swing value, performs matrix display on a display screen by using each one of combinations of each second coefficient value and each third coefficient value in the first coeffi...