ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,433, issued on March 25, was assigned to ANPEC ELECTRONICS Corp. (Hsinchu, Taiwan).
"Motor commutation testing circuit" was invented by Yi-Cheng Liu (New Taipei, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A motor commutation testing circuit is provided. When a commutation testing circuit determines that the motor commutation testing circuit enters a test mode, a selector circuit selects a commutation signal generating circuit and provides a simulated commutation signal generated by the commutation signal generating circuit to a control circuit. When the testing circuit determines that the motor commutation testing circuit enters a rotati...