US Patent Issued to Analog Devices on July 29 for "Determining LO leakage and quadrature error parameters of an RF front end" (New Jersey Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,375,115, issued on July 29, was assigned to Analog Devices Inc. (Wilmington, Mass.).

"Determining LO leakage and quadrature error parameters of an RF front end" was invented by Reza Alavi (Belle Mead, N.J.), Adam Ruan (Somerset, N.J.) and Yupeng Liu (Summitt, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method and a system to estimate LO leakage and quadrature error parameters for a transmitter RF front end, such as a direct up-conversion transmitter RF front end, in a joint fashion. The proposed method utilizes a PN sequence inserted at the transmitter baseband. At the observation receiver side, an RX accumulato...