US Patent Issued to ANALOG DEVICES INTERNATIONAL UNLtd. on Oct. 7 for "Apparatuses and methods for detecting cracks" (American, Israeli Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,126, issued on Oct. 7, was assigned to ANALOG DEVICES INTERNATIONAL UNLtd. COMPANY (Limerick, Ireland).

"Apparatuses and methods for detecting cracks" was invented by Yosef Stein (Sharon, Mass.) and Haim Primo (Ganei Tikva, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the present disclosure include a crack detection system having a crack detection sensor including a plurality of sectors disposed concentrically around a hole within the crack detection sensor, a plurality of contacts configured to electrically connect to one or more sectors of the plurality of sectors, and a crack detection circuit configured to measure resistances ...