US Patent Issued to Analog Devices International UnLtd. on June 10 for "Magnetic multi-turn sensor structures and fabrication" (German, Irish Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,483, issued on June 10, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland).

"Magnetic multi-turn sensor structures and fabrication" was invented by Jan Kubik (Limerick, Ireland), Jochen Schmitt (Biedenkopf, Germany) and Onur Necdet Urs (Hamburg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The techniques described are applicable to closed-loop magnetic multi-turn sensors including giant magnetoresistance (GMR-MT) sensors as well as tunnel magnetoresistive (TMR) multi-turn sensors. Techniques, e.g., lithography techniques, are described to form crossings so that a distortion of an ideal shape is reduced or minimized...