US Patent Issued to Analog Devices International UnLtd. on July 1 for "Angle of rotation determination in scanning LIDAR systems" (Chinese, American Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,812, issued on July 1, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland).

"Angle of rotation determination in scanning LIDAR systems" was invented by Yuansheng Dai (Shanghai), Tairan Sun (Shanghai), Tao Yu (Cambridge, Mass.) and Libo Meng (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for determining an angle of the light transmitted by an illumination source of a scanning LIDAR system are disclosed. An example LIDAR system includes a pattern, provided in an optical path of the light transmitted by the illumination source as the light is transmitted out of the system, and configured to reflect a...