US Patent Issued to Analog Devices International UnLtd. on Aug. 12 for "Apparatus and methods for electronic testing using beamforming integrated circuits as impedance tuners" (Egyptian Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,388,540, issued on Aug. 12, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland).

"Apparatus and methods for electronic testing using beamforming integrated circuits as impedance tuners" was invented by Islam A. Eshrah (Giza, Egypt).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatus and methods for electronic testing using beamforming integrated circuits (ICs) as impedance tuners are disclosed herein. In certain embodiments, an electronic testing setup for a device-under-test (DUT) includes a radio frequency (RF) coupler including a through line connected to an output of the DUT, a first coupled line coupled to the through li...