ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,699, issued on June 3, was assigned to AMS SENSORS SINGAPORE PTE. LTD. (Singapore).
"Detector wavelength calibration" was invented by Javier Miguel Sanchez (Zurich), Kotaro Ishizaki (Zurich), Peter Roentgen (Thalwil, Switzerland) and Francesco Paolo D'Aleo (Samstagern, Switzerland).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of calibrating a driving parameter of an optical component across an operating wavelength range of the component. The method comprises placing a layer of material in a light path, the layer of material being substantially planar and substantially transparent and having a thickness of the order of wavelengths in said ra...