ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,527,099, issued on Jan. 13, was assigned to ams-OSRAM AG (Premstaetten, Austria).
"X-ray radiation sensor device" was invented by Jose Manuel Garcia Gonzalez (San Antonio de Benageber, Spain), Joel Bertomeu Mestre (Oliva, Spain), Harald Etschmaier (Graz, Austria) and Rafael Serrano Gotarredona (Valencia, Spain).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray radiation sensor device may include a direct X-ray conversion layer, a plurality of electrodes to provide an electric charge in response to an interaction of an X-ray photon within the direct X-ray conversion layer, a plurality of pixel sensor arrays, and at least one interposer. The direct X...