US Patent Issued to AMS INTERNATIONAL on March 25 for "Reconstructing light wavelength spectrum with thin-film device" (Dutch Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,276, issued on March 25, was assigned to AMS INTERNATIONAL AG (Jona, Switzerland).

"Reconstructing light wavelength spectrum with thin-film device" was invented by Ruitao Zheng (Eindhoven, Netherlands) and James Archibald (Eindhoven, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A spectrometer device includes: a substrate including multiple light detector elements; a first filter layer on the substrate, in which the first filter layer includes multiple groups of filter stacks, each filter stack in the first filter layer including multiple dielectric films of alternating refractive index; and a second filter layer on the first filter la...