US Patent Issued to Ambarella International on Aug. 26 for "Automatic exposure metering for regions of interest that tracks moving subjects using artificial intelligence" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,337, issued on Aug. 26, was assigned to Ambarella International LP (Santa Clara, Calif.).

"Automatic exposure metering for regions of interest that tracks moving subjects using artificial intelligence" was invented by Jian Tang (Shanghai) and Tao Liu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus comprising an interface and a processor. The interface may be configured to receive pixel data. The processor may be configured to process the pixel data arranged as video frames, generate statistics and a timestamp for the video frames, perform computer vision operations on the video frames to determine one or more regions of interes...