US Patent Issued to Amazon Technologies on July 8 for "Overhang detection for use in three-dimensional object reconstruction" (American, French Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,354,215, issued on July 8, was assigned to Amazon Technologies Inc. (Seattle).

"Overhang detection for use in three-dimensional object reconstruction" was invented by Pierre-Alain Langlois (Vincennes, France) and Frederic Laurent Pascal Devernay (Bellevue, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method is disclosed to automatically detect overhangs from images with depth taken around an object during a scan of the object. An overhang detector can use an intersection of three filters based on these images and depth data associated with the images. The first filter looks for negative depth gradients along a 2D projection of a gravity vector,...