US Patent Issued to Amazon Technologies on July 1 for "Testing integrated circuit designs with accelerated replay" (Texas, California Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,643, issued on July 1, was assigned to Amazon Technologies Inc. (Seattle).

"Testing integrated circuit designs with accelerated replay" was invented by Siddharth Malkani (Leander, Texas), Horace Lau (Mountain View, Calif.), Sundeep Amirineni (Austin, Texas) and Dana Michelle Vantrease (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A technique to stress test an integrated circuit design under test in a simulation environment may include running a simulation that includes providing bus interface transactions and idle cycles on a bus interface of an integrated circuit design. The technique may further include capturing bus interface activ...