ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,170, issued on Dec. 2, was assigned to Amazon Technologies Inc. (Seattle).
"Scalable noise metrology for quantum circuits" was invented by Steven Thomas Flammia (Pasadena, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of estimating noise for individual gates of a quantum circuit uses averaged circuit eigenvalue sampling to determine an overall eigenvalue for the circuit. The circuit is sampled a sufficient number of times to fill a design matrix, wherein the design matrix allows for solving of a system of equations to determine eigenvalues for the individual gates using the averaged eigenvalue for the overall quantum circuit, the sam...