US Patent Issued to AMAZING MICROELECTRONIC on March 11 for "Diode test module for monitoring leakage current and its method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,248,019, issued on March 11, was assigned to AMAZING MICROELECTRONIC CORP. (New Taipei, Taiwan).

"Diode test module for monitoring leakage current and its method thereof" was invented by Chih-Ting Yeh (Hsinchu County, Taiwan), Sung Chih Huang (Yilan County, Taiwan), Kun-Hsien Lin (Hsinchu, Taiwan) and Che-Hao Chuang (Hsinchu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A diode test module and method applicable to the diode test module are provided. A substrate having first conductivity type and an epitaxial layer having second conductivity type on the substrate are formed. A well region having first conductivity type is formed in the e...