US Patent Issued to ALLEGRO MICROSYSTEMS on Nov. 11 for "Circuits and methods for shunt resistance measurement" (German Inventor)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,960, issued on Nov. 11, was assigned to ALLEGRO MICROSYSTEMS LLC (Manchester, N.H.).

"Circuits and methods for shunt resistance measurement" was invented by Emil Pavlov (Heidelberg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatus and methods for measuring a shunt resistance through which an input current flows, wherein the input current has a first frequency range, include a voltage source configured to generate an AC voltage having a second frequency range that is higher than the first frequency range. An inductor, a capacitor, and the shunt resistance form an RLC network to which the voltage source is coupled. Processing circuitry...