US Patent Issued to Allegro MicroSystems on May 20 for "Fabricating an electroconductive contact on a top surface of a tunneling magnetoresistance element" (American, Taiwanese, French Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,310,246, issued on May 20, was assigned to Allegro MicroSystems LLC (Manchester, N.H.).

"Fabricating an electroconductive contact on a top surface of a tunneling magnetoresistance element" was invented by Sundar Chetlur (Frisco, Texas), Maxim Klebanov (Palm Coast, Fla.), Yen Ting Liu (Hsinchu, Taiwan) and Paolo Campiglio (Arcueil, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one aspect, a method includes depositing a capping layer on a semiconductor device structure. The semiconductor device includes a plurality of tunneling magnetoresistance (TMR) elements, a corresponding one hard mask on each TMR element, a metal layer, and a plurality of...