US Patent Issued to Allegro MicroSystems on June 3 for "Controlling out-of-plane anisotropy in an MR sensor with free layer dusting" (British, French Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,870, issued on June 3, was assigned to Allegro MicroSystems LLC (Manchester, N.H.).

"Controlling out-of-plane anisotropy in an MR sensor with free layer dusting" was invented by Samridh Jaiswal (London) and Paolo Campiglio (Arcueil, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatus for a magnetoresistive (MR) sensor a free layer with a thickness of the CoFeB material to produce out-of-plane sensing for the sensor and a reference layer magnetically coupled to the free layer. A dusting layer of an oxide material is disposed on the free layer to achieve perpendicular magnetic anisotropy for an interface of the oxide layer and t...