US Patent Issued to Allegro MicroSystems on July 8 for "Reducing angle error in angle sensor due to orthogonality drift over magnetic-field" (British, Taiwanese, French, German Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,832, issued on July 8, was assigned to Allegro MicroSystems LLC (Manchester, N.H.).

"Reducing angle error in angle sensor due to orthogonality drift over magnetic-field" was invented by Samridh Jaiswal (London), Paolo Campiglio (Arcueil, France), Ronald Lehndorff (Mainz, Germany) and Yen Ting Liu (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one aspect, a method includes manufacturing a magnetic-field angle sensor on a wafer. The manufacturing includes forming a cosine bridge that includes forming a first magnetoresistance (MR) element. The manufacturing also includes forming a sine bridge that includes forming a second MR elemen...