US Patent Issued to Alcon on Nov. 18 for "Vision quality assessment based on machine learning model and wavefront analysis" (Texas Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,471,774, issued on Nov. 18, was assigned to Alcon Inc. (Fribourg, Switzerland).

"Vision quality assessment based on machine learning model and wavefront analysis" was invented by Ramesh Sarangapani (Coppell, Texas) and Mark VonTress (Arlington, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method of assessing vision quality of an eye is presented, with a controller having a processor and tangible, non-transitory memory on which instructions are recorded. The controller is configured to selectively execute at least one machine learning model. Execution of the instructions by the processor causes the controller to: receive wavefront ab...