US Patent Issued to Alcon on July 15 for "Ocular aberrometer systems and methods" (California, Washington, Tennessee Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,357,171, issued on July 15, was assigned to Alcon Inc. (Fribourg, Switzerland).

"Ocular aberrometer systems and methods" was invented by Max Hall (Irvine, Calif.), Thomas Padrick (Seattle) and Edwin Jay Sarver (Cookeville, Tenn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are disclosed for systems and methods to provide improved ocular aberrometry. An ocular aberrometry system includes a wavefront sensor configured to provide wavefront sensor data associated with an optical target monitored by the ocular aberrometry system and a logic device configured to communicate with the wavefront sensor. The logic device is configured to receive ocul...