US Patent Issued to Alcon on Feb. 3 for "Optical coherence metrology and tomography with improved registration" (Australian Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,539,035, issued on Feb. 3, was assigned to Alcon Inc. (Fribourg, Switzerland).

"Optical coherence metrology and tomography with improved registration" was invented by Steven James Frisken (Vaucluse, Australia) and Grant Andrew Frisken (Mitcham, Australia).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatus are provided for optical coherence metrology or tomography across an extended area of an eye with improved registration. At least two optical coherence tomograms are acquired, with each tomogram containing data from regions of an anterior surface of the eye that are at least partially overlapping, and data from one or more deeper struct...