ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,398,466, issued on Aug. 26, was assigned to AIXTRON SE (Herzogenrath, Germany).
"Method for emissivity-corrected pyrometry" was invented by Karsten Rojek (Monchengladbach, Germany) and Dirk Heydhausen (Aachen, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A substrate is coated with a multilayer structure which has layers of a first portion and layers of a second portion that are deposited on the layers of the first portion. During the deposition of at least one layer of the second portion, at least one optical measuring apparatus measures an emissivity value and a reflectance value on the broad side of the substrate, which broad side comprises ...