US Patent Issued to Aikemy on Sept. 23 for "Devices, systems, and methods for analyzing measurement objects" (Swiss Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,353, issued on Sept. 23, was assigned to Aikemy GmbH (Zurich).

"Devices, systems, and methods for analyzing measurement objects" was invented by Kotaro Ishizaki (Zurich) and Agata Dorota Ishizaki-Sroka (Zurich).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device for analyzing a sample includes a measurement area at which the sample is to be located, an illumination arrangement, and first and second spectral sensors. The illumination arrangement illuminates the measurement area such that the illumination is incident on the sample. Each of the first and second spectral sensors is oriented toward the measurement area to collect illumination arrivin...