US Patent Issued to Agency for Science, Technology and Research on March 25 for "Defect detection in image space" (Singaporean Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,538, issued on March 25, was assigned to Agency for Science, Technology and Research (Singapore).

"Defect detection in image space" was invented by Jierong Cheng (Singapore), Ying Sun (Singapore), Wei Xiong (Singapore), Wenyu Chen (Singapore), Yusha Li (Singapore) and Ying Quan (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "This invention relates to a method for training a neural network, comprising detecting a hole in each training image of a plurality of training images; transforming each training image into a transformed image, to suppress non-crack information in the training image; and training a neural network using the transformed...