US Patent Issued to AEHR TEST SYSTEMS on May 13 for "Controlling alignment during a thermal cycle" (California Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,328, issued on May 13, was assigned to AEHR TEST SYSTEMS (Fremont, Calif.).

"Controlling alignment during a thermal cycle" was invented by Scott E. Lindsey (Brentwood, Calif.), Junjye Yeh (Livermore, Calif.), Jovan Jovanovic (Santa Clara, Calif.) and Seang P. Malathong (Newark, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against co...