US Patent Issued to AEHR TEST SYSTEMS on June 10 for "System for testing an integrated circuit of a device and its method of use" (California Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,472, issued on June 10, was assigned to AEHR TEST SYSTEMS (Fremont, Calif.).

"System for testing an integrated circuit of a device and its method of use" was invented by Scott E. Lindsey (Brentwood, Calif.), Jovan Jovanovic (Santa Clara, Calif.), David S. Hendrickson (San Jose, Calif.) and Donald P. Richmond II (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the...