US Patent Issued to Advantest Test Solutions on June 3 for "Passive carrier-based device delivery for slot-based high-volume semiconductor test system" (Japanese, American Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,852, issued on June 3, was assigned to Advantest Test Solutions Inc. (San Jose, Calif.).

"Passive carrier-based device delivery for slot-based high-volume semiconductor test system" was invented by Karthik Ranganathan (Foothill Ranch, Calif.), Gregory Cruzan (San Jose, Calif.), Samer Kabbani (San Jose, Calif.), Gilberto Oseguera (Corona, Calif.), Ira Leventhal (San Jose, Calif.), Hiroki Ikeda (Kukishi Saitama, Japan) and Toshiyuki Kiyokawa (Kukishi Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot com...