US Patent Issued to Advantest Test Solutions on July 29 for "Carrier based high volume system level testing of devices with pop structures" (California Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,374,420, issued on July 29, was assigned to Advantest Test Solutions Inc. (San Jose, Calif.).

"Carrier based high volume system level testing of devices with pop structures" was invented by Karthik Ranganathan (Foothill Ranch, Calif.), Gregory Cruzan (Anaheim, Calif.), Samer Kabbani (Laguna Niguel, Calif.), Gilberto Oseguera (Corona, Calif.) and Ira Leventhal (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board com...