US Patent Issued to Advantest Test Solutions on July 1 for "Integrated test cell using active thermal interposer (ATI) with parallel socket actuation" (California Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,756, issued on July 1, was assigned to Advantest Test Solutions Inc. (San Jose, Calif.).

"Integrated test cell using active thermal interposer (ATI) with parallel socket actuation" was invented by Karthik Ranganathan (San Jose, Calif.), Gregory Cruzan (San Jose, Calif.), Samer Kabbani (San Jose, Calif.), Gilberto Oseguera (San Jose, Calif.), Rohan Gupte (San Jose, Calif.), Homayoun Rezai (San Jose, Calif.), Kenneth Santiago (San Jose, Calif.) and Marc Ghazvini (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing apparatus comprises a test interface board comprising a plurality of socket interface boards, wherein each socket inte...