US Patent Issued to Advantest Test Solutions on Feb. 25 for "Parallel test cell with self actuated sockets" (Japanese, American Inventors)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,235,314, issued on Feb. 25, was assigned to Advantest Test Solutions Inc (San Jose, Calif.).

"Parallel test cell with self actuated sockets" was invented by Karthik Ranganathan (Foothill Ranch, Calif.), Gilberto Oseguera (Corona, Calif.), Gregory Cruzan (Anaheim, Calif.), Joe Koeth (San Jose, Calif.), Ikeda Hiroki (Kukishi Saitama, Japan) and Kiyokawa Toshiyuki (Kukishi Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automated test equipment (ATE) includes a test interface board assembly. The test interface board includes a socket configured to provide electrical couplings from the test interface board to a device under test (DUT). The ...