ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,235, issued on Oct. 28, was assigned to ADVANTEST Corp. (Tokyo).
"Optical comb measuring apparatus" was invented by Takao Sakurai (Miyagi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An optical comb measuring apparatus that measures an irradiation target having multiple types of measuring targets, includes: an interference signal acquiring section; and a frequency spectrum measuring section. The interference signal acquiring section acquires an interference signal between a post-irradiation signal comb obtained by irradiating the irradiation target with a pre-irradiation signal comb and a local comb set to be different from a repetition fre...