US Patent Issued to Advantest on Oct. 21 for "Test system configuration adapter systems and methods" (California Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,444, issued on Oct. 21, was assigned to Advantest Corp. (Tokyo).

"Test system configuration adapter systems and methods" was invented by Eddy Wayne Chow (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system configuration adapter includes a tester side socket, a break out pin, and a device under test side slot. The tester side socket is configured to couple with a test equipment socket. The break out pin is configured to couple with the supplemental equipment. The devic...